Academia 2011
Workshop:
Defects in Semiconductors and their Characterization
20.09.2011 and 21.09.2011, Leipzig, Germany
The Academia 2011 takes place on
Tuesday, 20.09.2011, from 9:00 to Wednesday, 21.09.2011, 12:00
in the Universität Leipzig, Fakultät für Physik und Geowissenschaften, Hörsaal für Theoretische Physik, Linnéstraße 5, Leipzig, Germany.
Flyer (PDF)
Program (PDF)
Registration form (PDF)
For questions please consult our office at +49 (0)341 97-32650 (Ms. Anja Heck).
Scope of the workshop
A perfect semiconductor is in principle useless for electrical and electronic application. It is the defects which
allow tailoring properties like electrical conductivity, minority carrier lifetime or absorption to name a few.
Within this workshop defect properties and the impact of defects on physical properties of semiconductors will be referred and discussed.
Further complementary methods used to caracterize defects in semiconductors will be presented and their strength and
weaknesses exemplified. In the end, the participants will have an overview of the electrical, morphological and structural characterization
of semiconducting material and devices.
Program
The program will consist of seven invited lectures.
Invited speakers
- Prof. Dr. Tony Peaker, The University of Manchester, UK
Deep Level Transient Spectroscopy
PDF
- Prof. Dr. Reinhard Krause-Rehberg, Universität Halle, Germany
Defects in Semiconductors Studied by Positron Annihilation
PDF
- Prof. Dr. Francois Danie Auret, University of Pretoria, South Africa
Laplace-DLTS and its Applications
PDF
- Prof. Dr. Lukas M. Eng, Technische Universität Dresden, Germany
Semiconductors analyzed by Scanning Probe Methods
PDF
- Dr. Martin Albrecht, Leibniz-Institut für Kristallzüchtung (IKZ), Berlin, Germany
Transmission Electron Microscopy of Alloys, Defects and Interfaces in Semiconductors
- Dr. Walter E. Meyer, University of Pretoria, South Africa
Metastable Defects
PDF
- Matthias Schmidt, Universität Leipzig, Germany
Space charge layer spectroscopy with optical excitation
PDF
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