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Hirsch indices (based on ISI Web of Science)
all papers:
h=56, m=2.3 (04/2013, 370 publ., 13221 cit. (11868 w/o self cit.), 5 most quoted: 920, 746, 600, 531, 396)
Leipzig papers only:
h=34, m=2.8 (04/2013, 230 publ., 4604 cit. (3791 w/o self cit.), 5 most quoted: 263, 258, 247, 151, 146)
Hirsch indices (based on Google Scholar): all: 63, last 5 years: 43
  Researcher-ID

all journals AdvMat APL JAP JJAP PRA PRB PRL NT NL JEM SSE SSC SST SLMS TSF JCG NJP pss(a) pss(b) pss(c) pss(RRL) JVSTA JVSTB MRS SPIE

all years 2013 2012 2011 2010 2009 2008 2007 2006 2005 2000-2004 1995-1999 1990-1994 1988-1989

all authors Grundmann Lorenz von Wenckstern Pickenhain Rheinländer Schmidt-Grund Bimberg Alferov Christen Krost

all info no icons RTF Uni

19
M. Schmidt, M. Ellguth, R. Karsthof, H. von Wenckstern, R. Pickenhain, M. Grundmann, G. Brauer, F.C.C. Ling
On the T2 trap in zinc oxide thin films

phys. stat. sol. (b) 249(3), 588-595 (2012)
[ pdf | doi ]

18
Matthias Schmidt, Holger von Wenckstern, Rainer Pickenhain, Marius Grundmann
On the investigation of electronic defect states in ZnO thin films by space charge spectroscopy with optical excitation

Sol. St. Electr. 75, 48-54 (2012)
[ pdf | doi ]

17
M. Ellguth, M. Schmidt, R. Pickenhain, M. Grundmann
Characterization of point defects in ZnO thin films by Optical Deep Level Transient Spectroscopy

phys. stat. sol. (b) 248(4), 941-949 (2011)
[ pdf | doi ]

16
Matthias Schmidt, Kerstin Brachwitz, Florian Schmidt, Martin Ellguth, Holger von Wenckstern, Rainer Pickenhain, Marius Grundmann, Gerhard Brauer, Wolfgang Skorupa
Nickel-related defects in ZnO - A deep-level transient spectroscopy and photo-capacitance study

phys. stat. sol. (b) 248(8), 1949-1955 (2011)
[ pdf | doi ]

15
M. Schmidt, M. Ellguth, F. Schmidt, Th. Lüder, H. von Wenckstern, R. Pickenhain, M. Grundmann, G. Brauer, W. Skorupa
Defects in a nitrogen-implanted ZnO thin film

phys. stat. sol. (b) 247, 1220-1226 (2010)
[ pdf | doi ]

14
M. Schmidt, M. Ellguth, C. Czekalla, H. von Wenckstern, R. Pickenhain, M. Grundmann, G. Brauer, W. Skorupa, M. Helm, Q. Gu, Ch.Ch. Ling
Defects in zinc-implanted ZnO thin films

J. Vac. Sci. Technol. B 27, 1597-1600 (2009)
[ pdf | doi ]

13
H. von Wenckstern, H. Schmidt, M. Brandt, A. Lajn, R. Pickenhain, M. Lorenz, M. Grundmann, D.M. Hofmann, A. Polity, B.K. Meyer, H. Saal, M. Binnewies, A. Börger, K.-D. Becker, V.A. Tikhomirov, K. Jug
Anionic and cationic substitution in ZnO

phys. stat. sol. (c) 37, 153-172 (2009)
[ pdf | doi ]

12
H. von Wenckstern, M. Brandt, H. Schmidt, G. Biehne, R. Pickenhain, H. Hochmuth, M. Lorenz, M. Grundmann
Donor like defects in ZnO substrate materials and ZnO thin films

Appl. Phys. A 88, 135-139 (2007)
[ pdf | doi ]

11
H. von Wenckstern, R. Pickenhain, H. Schmidt, M. Brandt, G. Biehne, M. Lorenz, M. Grundmann, G. Brauer
Investigation of acceptor states in ZnO by junction DLTS

Superlatt. Microstr. 42, 14-20 (2007)
[ pdf | doi ]

10
M. Schmidt, R. Pickenhain, M. Grundmann
Exact Solutions for the Capacitance of Space Charge Regions at Semiconductor Interfaces

Sol. St. Electr. 51, 1002-1004 (2007)
[ pdf | doi ]

9
H. von Wenckstern, R. Pickenhain, H. Schmidt, M. Brandt, G. Biehne, M. Lorenz, M. Grundmann
Deep acceptors states in ZnO single crystals

Appl. Phys. Lett. 89, 092122 (3 pages) (2006)
[ pdf | doi ]

8
Holger von Wenckstern, Swen Weinhold, Gisela Biehne, Rainer Pickenhain, Heidemarie Schmidt, Holger Hochmuth, and Marius Grundmann
Donor levels in ZnO

Adv. Sol. St. Phys. 45, 263-274 (2005)
[ pdf ]

7
H. von Wenckstern, S. Weinhold, G. Biehne, R. Pickenhain, E.M. Kaidashev, M. Lorenz, M. Grundmann
Static and transient capacitance spectroscopy on ZnO

Proc. 27th Int. Conf. on the Physics of Semiconductors (ICPS-27) (Flagstaff, AZ, 2004); AIP Conf. Proc. 772, 197-198 (2005)
[ pdf | doi ]

6
Holger von Wenckstern, Rainer Pickenhain, Swen Weinhold, Michael Ziese, Pablo Esquinazi, Marius Grundmann
Electrical properties of Ni/GaAs and Au/GaAs Schottky contacts in high magnetic fields

Proc. 27th Int. Conf. on the Physics of Semiconductors (ICPS-27) (Flagstaff, AZ, 2004); AIP Conf. Proc. 772, 1333-1334 (2005)
[ pdf | doi ]

5
M. Grundmann, H. von Wenckstern, R. Pickenhain, Th. Nobis, A. Rahm, M. Lorenz
Electrical Properties of ZnO Thin Films and Optical Properties of ZnO-based Nanostructures

Superlatt. Microstr. 38, 317-328 (2005)
[ pdf | doi ]

4
M. Grundmann, H. von Wenckstern, R. Pickenhain, S. Weinhold, B. Chengnui, O. Breitenstein
Electrical properties of ZnO thin films and single crystals

NATO Science Series II: Mathematics, Physics and Chemistry 194, 47-57 (2005), N.H. Nickel, E. Terukov, eds. (Kluwer, Dordrecht, 2005), ISBN 1-4020-3474-1
[ pdf ]

3
E. Guzman, H. Hochmuth, M. Lorenz, H. von Wenckstern, A. Rahm, E.M. Kaidashev, M. Ziese, A. Setzer, P. Esquinazi, A. Pöppl, D. Spemann, R. Pickenhain, H. Schmidt, M. Grundmann
Pulsed laser deposition of Fe- and Fe, Cu-doped ZnO thin films

Ann. Phys. 13, 57-58 (2004)
[ pdf | doi ]

2
H. von Wenckstern, E. M. Kaidashev, M. Lorenz, H. Hochmuth, G. Biehne, J. Lenzner, V. Gottschalch, R. Pickenhain, M. Grundmann
Lateral homogeneity of Schottky contacts on n-type ZnO

Appl. Phys. Lett. 84, 79-81 (2004)
[ pdf | doi ]

1
H. von Wenckstern, H. Schmidt, R. Pickenhain, M. Grundmann
Conduction band offset of pseudomorphic InAs/GaAs determined by capacitance spectroscopy

Proc. 26th Int. Conf. on the Physics of Semiconductors, Edinburgh (ICPS-26), Institute of Physics Conference Series 171, H2 (7 pages) (2003) (IoP Publishing, Bristol), ISBN 978-0-7503-0924-0
[ pdf ]