X-Ray diffraction analysis of polycristalline solid samples and thin layers
Supervisor: Prof. Dr.
Michael Lorenz
The experiments introduce the x-ray
structural analysis on solid state samples with the help of a modern
powder diffractometer. One may also study the creation and the
properties of x-rays during the experiments. Important crystallographic
terms as axis systems, Millers indices, structural amplitudes, and
scattering factors are imparted. The experiments give information on
the benefits and the problems of the radiation protection while using
ionising photon beams for technical and medical purposes.
The following exercises are to be solved:
- Exact determination of lattice constants of polycrystalline Si and Al
- Determination of the crystal size and of the percentage of lattice distortions of a aluminium sample
- Registration of the diffraction pattern of polycrystalline high temperature super conducting samples and of textured YBCO-thin films
- with a diffusion barrier on a single crystal substrate for illustration of the texture and epitaxy of thin films
- Use of a modern crystallographic software for modelling of real unit cellsand x-ray diffraction patterns